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Title:
SYSTEM DEVISE AND METHODS FOR MEASURING SUBSTANCES' DIELECTRIC PROPERTIES USING MICROWAVE SENSORS
Document Type and Number:
WIPO Patent Application WO/2016/174675
Kind Code:
A3
Abstract:
Systems, device and methods are provided for measuring parameters of a medium such as the dielectric properties of a medium including a plurality of layers, using an array of sensors. The array comprises at least two transducers and at least one transceiver attached to said at least two transducers, the at least one transceiver is configured to transmit at least one signal toward the medium and receive a plurality of signals affected by the medium; a data acquisition unit and at least one processor unit, configured to: process the affected plurality of signals to yield a plurality of transfer functions wherein each of said plurality of transfer functions comprising said medium response between two transducers of said at least two transducers as function of frequency or time; and process the plurality of transfer functions to yield a plurality of statistical measures, and process said statistical measures to calculate said medium parameters.

Inventors:
LOMNIZ, Yuval (54 Borochov Street, 93 Herzlia, 4624093, IL)
ROSENFELD, Jonathan (Itshak elkhanan 5/1 Street, 05 Ramat hasharon, 4721805, IL)
COHEN, Doron (5 Moshe Sharet street, Tel Aviv, 10 Tel-Aviv, 6209210, IL)
SHAYOVITZ, Shachar (20 Moshe Lerrer street, 98 Ness Ziona, 7404998, IL)
Application Number:
IL2016/050440
Publication Date:
November 03, 2016
Filing Date:
April 26, 2016
Export Citation:
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Assignee:
VAYYAR IMAGING LTD (11 Altalef St, 03 Yehud, 5610103, IL)
International Classes:
G01N9/24; G01N22/00; G01N23/08; G01R11/54; G06F17/18
Foreign References:
US20140278445A12014-09-18
US20150097579A12015-04-09
US20110098972A12011-04-28
US20060034726A12006-02-16
US20030115232A12003-06-19
Attorney, Agent or Firm:
LEVY, Naftali (Rav Ashi 8A street, 04 Jerusalem, 9330904, IL)
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