Title:
SYSTEM FOR ESTIMATING FAILURE IN CELL MODULE
Document Type and Number:
WIPO Patent Application WO/2014/115513
Kind Code:
A1
Abstract:
In a system (1) for estimating failure in cell module, a failure estimating device (20) includes: a state of charge calculation unit (30) for calculating the state of charge of a cell module (6); a ∆SOC calculation unit (31) for calculating change of the state of charge ∆SOC from the state of charge of the cell module (6); a ∆V integrated value calculation unit (32) for calculating ∆V representing differences between maximum terminal voltage values and minimum terminal voltage values among a plurality of cell blocks, and calculating a ∆V integrated value obtained by successive integration of the calculated ∆V; and a cell failure number estimating unit (33) that refers to an association file (35) in which relationships of ∆SOC and ∆V integrated values, which are stored in a storage unit (21), are associated with cell failure numbers, and estimates a number of cell failures that corresponds to the calculated ∆SOC and ∆V integrated values.
Inventors:
KOBAYASHI NORIHARU
TAKEDA MUTSUHIKO
MORIMOTO NAOHISA
TAKEDA MUTSUHIKO
MORIMOTO NAOHISA
Application Number:
PCT/JP2014/000179
Publication Date:
July 31, 2014
Filing Date:
January 16, 2014
Export Citation:
Assignee:
SANYO ELECTRIC CO (JP)
International Classes:
G01R31/36; H01M10/42; H01M10/48; H02J7/00
Domestic Patent References:
| WO2012102115A1 | 2012-08-02 |
Foreign References:
| JP2000123883A | 2000-04-28 | |||
| JP2011137682A | 2011-07-14 | |||
| JP2012052962A | 2012-03-15 |
Attorney, Agent or Firm:
TOKUDA, Yoshiaki et al. (JP)
Yoshiaki Tokuda (JP)
Yoshiaki Tokuda (JP)
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