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Title:
SYSTEM IDENTIFICATION METHOD, SYSTEM IDENTIFICATION DEVICE, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/255504
Kind Code:
A1
Abstract:
This system identification method comprises: a step (S1) for measuring frequency responses (ω, HR1), (ω, HR2)…, and (ω, HRn) in a real system under n sets of disturbances of different magnitudes; a step (S3) for calculating frequency responses (ω, HM1), (ω, HM2)…, (ω, HMn) from input to output in n sets of mechanical models M1 to Mn including i sets (i is an integer of 1 or greater) of common parameters that do not change due to disturbance and j sets of disturbance variable parameters that do change due to disturbance; a step (S4) for calculating the values of a total of n sets of evaluation functions F (HRk, HMk) and the sum σF thereof; and steps (S3 to S6) for searching for the values of i sets of common parameters and j × n sets of disturbance variable parameters for which the sum σF would meet convergence conditions.

Inventors:
AKIYAMA TAKAO (JP)
Application Number:
PCT/JP2020/011937
Publication Date:
December 24, 2020
Filing Date:
March 18, 2020
Export Citation:
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Assignee:
MEIDENSHA ELECTRIC MFG CO LTD (JP)
International Classes:
G05B13/02; G01M15/02
Foreign References:
JP2008203051A2008-09-04
JP2013142687A2013-07-22
JP2012098989A2012-05-24
Attorney, Agent or Firm:
SHOBAYASHI Masayuki et al. (JP)
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