SYSTEM FOR MEASURING CONTOUR OF CURVED SURFACE OF TRANSPARENT OR SEMI-TRANSPARENT MATERIAL

WIPO Patent Application WO/2020/220168

A1

Disclosed is a system for measuring the contour of a curved surface of a transparent or semi-transparent material. The system comprises: an illumination device for emitting an illuminating light beam in a wide spectrum band; a dispersive objective lens, which is located in an emergent light direction of the illuminating light beam and is used for dispersing and decomposing the transmitted illuminating light beam into a set of monochromatic light beams with a convergence point corresponding to a wavelength; a test material support member for fixing a transparent or semi-transparent curved surface test material; a spectral analysis device for receiving upper surface reflected light and lower surface reflected light, and measuring a spectral chromatic aberration between the upper surface reflected light and the lower surface reflected light; and a processor for receiving the spectral chromatic aberration, obtaining the thickness of a scanned position according to the spectral chromatic aberration, and determining the contour of the transparent or semi-transparent curved surface test material according to the thickness of two or more scanned positions. The system can accurately detect a contour without being affected by the light transmittance of a test material.

WANG XINGZE (CN)
YAN JING (CN)
HE LIANGYU (CN)

PCT/CN2019/084845

November 05, 2020

April 28, 2019

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HEREN KEJI SHENZHEN LLC (CN)

G01B11/06; G01M11/00

CN202748008U	2013-02-20
CN106871798A	2017-06-20
CN104061867A	2014-09-24
CN1657872A	2005-08-24
DE10325942A1	2005-01-05

SCIHEAD IP LAW FIRM (CN)

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