SYSTEM AND METHOD FOR ANALYZING EFFICIENCIES OF PLANT APPARATUSES

WIPO Patent Application WO/2016/208316

A1

In the event of a reduction in the efficiencies of apparatuses constituting a plant, the degrees of influence of factors that resulted in the efficiency reduction have not been quantitatively evaluated, and thus, it has not been possible to create an optimal maintenance plan. In order to solve this problem, the present invention provides a plant-apparatus efficiency analyzing system for analyzing the efficiencies of apparatuses constituting a plant, the system being characterized by including: an apparatus-efficiency calculating unit that obtains apparatus efficiencies on the basis of measured information about the plant apparatuses; an apparatus-factor obtaining unit that obtains apparatus factors that cause changes in the apparatus efficiencies; and an influence-coefficient calculating unit that obtains influence coefficients indicating the degrees of efficiency changes caused by the individual apparatus factors, and characterized in that the amounts of changes in the efficiencies are obtained on the basis of the influence coefficients.

HAYASHI YOSHIHARU (JP)
SEKIAI TAKAAKI (JP)
FUKAI MASAYUKI (JP)
MURAKAMI MASAHIRO (JP)
JYOUE KAZUTAKA (JP)

PCT/JP2016/065374

December 29, 2016

May 25, 2016

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HITACHI LTD (JP)

G06Q50/06; G05B23/02; G06Q50/04

JP2005133583A	2005-05-26
JP2004211587A	2004-07-29
JPH11229820A	1999-08-24
JP2014174993A	2014-09-22

INOUE Manabu et al. (JP)
Manabu Inoue (JP)

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