Title:
SYSTEM AND METHOD FOR MEASURING THREE-DIMENSIONAL SHAPE OF FREEFORM SURFACE BY USING ULTRAFAST DEFLECTION MEASUREMENT METHOD USING COMPOSITE PATTERN
Document Type and Number:
WIPO Patent Application WO/2021/020603
Kind Code:
A1
Abstract:
The present invention relates to a shape measurement system and method using an ultrafast deflection measurement method using a composite pattern. More particularly, the present invention relates to a shape measurement system using an ultrafast deflection measurement method using a composite pattern, the shape measurement system comprising: a composite pattern generation unit for projecting a composite pattern obtained by synthesizing patterns having different frequencies onto an object to be measured; a detector for obtaining an image of a modified composite pattern reflected from the object; a phase acquisition unit for acquiring a wrapped phase for each frequency from the composite pattern and acquiring an unwrapped phase from each wrapped phase; and an analysis means for measuring and analyzing a 3D shape of the object from the acquired phases.
Inventors:
GHIM YOUNG-SIK (KR)
NGUYEN THE-MAHN (KR)
RHEE HYUG-GYO (KR)
NGUYEN THE-MAHN (KR)
RHEE HYUG-GYO (KR)
Application Number:
PCT/KR2019/009392
Publication Date:
February 04, 2021
Filing Date:
July 29, 2019
Export Citation:
Assignee:
KOREA RES INSTITUTE OF STANDARD AND SCIENCE (KR)
International Classes:
G01B11/25; G01B9/02
Domestic Patent References:
| WO2005049840A2 | 2005-06-02 |
Foreign References:
| KR20020082738A | 2002-10-31 | |||
| KR20010002383A | 2001-01-15 | |||
| KR100901537B1 | 2009-06-08 | |||
| KR101479249B1 | 2015-01-05 |
Attorney, Agent or Firm:
IPUS PATENT & LAW FIRM (KR)
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