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Title:
SYSTEM AND METHOD FOR MEASURING TIME-FREQUENCY CHARACTERISTIC OF HIGH-FREQUENCY ELECTROMAGNETIC SIGNAL
Document Type and Number:
WIPO Patent Application WO/2018/206006
Kind Code:
A1
Abstract:
Disclosed are a system and method for measuring electromagnetic signal characteristics. The measurement system comprises a multi-repetition frequency pulsed light source, a frequency mixing apparatus for electrical signals and optical signals, and a data collecting and processing unit. The measurement system accurately calculates to obtain, by means of measuring a low-bandwidth mixed-frequency signal generated by the multi-repetition frequency pulsed light source and a signal to be measured in the frequency mixing apparatus, characteristic information such as frequency, phase, and strength of the signal to be measured, and a variation quantity thereof. The system has advantages such as a simple structure, high measurement accuracy, low costs, a large range of signal frequency which can be measured thereby, etc., and can be applicable to various electromagnetic spectra from microwave, millimeter wave, terahertz and even to optical wave.

Inventors:
ZHAO XIN (CN)
LI CUI (CN)
ZHENG ZHENG (CN)
Application Number:
PCT/CN2018/086573
Publication Date:
November 15, 2018
Filing Date:
May 11, 2018
Export Citation:
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Assignee:
UNIV BEIHANG (CN)
International Classes:
G01R23/17; G01R29/08
Foreign References:
CN106980045A2017-07-25
CN106093598A2016-11-09
CN102159926A2011-08-17
CN103148940A2013-06-12
CN102608825A2012-07-25
CN103292918A2013-09-11
CN104316186A2015-01-28
CN102508231A2012-06-20
DE102015008652A12016-01-14
KR20100043463A2010-04-29
Attorney, Agent or Firm:
YUHONG INTELLECTUAL PROPERTY LAW FIRM (CN)
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