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Title:
SYSTEM AND METHOD FOR A NON-DESTRUCTIVE TEST USING COMPRESSED HEAT
Document Type and Number:
WIPO Patent Application WO/2011/065755
Kind Code:
A3
Abstract:
The present invention relates to a non-destructive test using compressed heat, and more particularly, to a non-destructive test system using compressed heat, comprising: gas-compressing means for supplying a gas and compressing the gas in a hollow object under test such that compressed heat is generated in the hollow object to be tested; thermal image detecting means for detecting, in an image of infrared waves, the temperature of the surface of the object under test in which the compressed heat is generated, and transmitting the image; and analyzing means for analyzing, using the image transmitted from the thermal image detecting means, the temperature distribution at the surface of the object under test so as to detect defects in the object under test or to test the thinning of the object. The non-destructive test system of the present invention can detect defects in a hollow pipe or a vessel having an open side, such as cracks, air gaps (holes), deformations, and portions containing foreign substances, and also can test the thinning of the hollow pipe or the vessel having an open side using compressed heat.

Inventors:
PARK HEE SANG (KR)
CHOI MAN YONG (KR)
PARK JEONG HAK (KR)
LEE SEUNG SEOK (KR)
Application Number:
PCT/KR2010/008368
Publication Date:
November 03, 2011
Filing Date:
November 25, 2010
Export Citation:
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Assignee:
KOREA RES INST OF STANDARDS (KR)
PARK HEE SANG (KR)
CHOI MAN YONG (KR)
PARK JEONG HAK (KR)
LEE SEUNG SEOK (KR)
International Classes:
G01N25/72; G06T7/00
Foreign References:
JP2006189410A2006-07-20
JP2005214812A2005-08-11
Other References:
KIM, KYOUNG-SUK ET AL.: "Defect detection of wall thinning defect in pipes using Lock-in photo-infrared thermography technique", KSME 2008 FALL CONFERENCE JOURNAL, KSME, 2008, pages 317 - 321
Attorney, Agent or Firm:
KIM, Moon Jong et al. (648-15 Yeoksam-Dong,Gangnam-Gu, Seoul 135-080, KR)
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Claims: