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Title:
A SYSTEM AND METHOD FOR TESTING AND CONFIGURING SEMICONDUCTOR FUNCTIONAL CIRCUITS
Document Type and Number:
WIPO Patent Application WO2005029329
Kind Code:
A3
Abstract:
Disclosed here are systems and methods to enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors including manufacturing defects, compatibility characteristics, performance requirements, and system health (e.g., the number of components operating properly). Functional component operational behavior is tested and analyzed at various levels of configuration abstraction and component organization (e.g., topological inversion analysis). The testing and analysis can be performed in parallel on numerous functional components. Functional component configuration related information is presented in a graphical user interface (GUI) at various levels of granularity and in real time. The graphical user interface can facilitate user interaction in recognizing failure patterns, production test tuning and field configuration algorithm adjustment. The testing and analysis information can also be organized in a variety of convenient database formats.

Inventors:
DIAMOND MICHAEL B (US)
MONTRYM JOHN S (US)
VAN DYKE JAMES M (US)
NAGY MICHAEL B (US)
TREICHLER SEAN J (US)
Application Number:
PCT/US2004/030127
Publication Date:
January 26, 2006
Filing Date:
September 13, 2004
Export Citation:
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Assignee:
NVIDIA CORP (US)
DIAMOND MICHAEL B (US)
MONTRYM JOHN S (US)
VAN DYKE JAMES M (US)
NAGY MICHAEL B (US)
TREICHLER SEAN J (US)
International Classes:
G01M99/00; G01R31/26; G01R31/3185; G06F11/00; G06F11/267; G06F17/50; G06F19/00; G09G5/02; H01L21/66; (IPC1-7): G06F11/00; G01R31/3185; H01L21/66
Foreign References:
US6504841B12003-01-07
US5513354A1996-04-30
US5276893A1994-01-04
US5956252A1999-09-21
US6067262A2000-05-23
US6377898B12002-04-23
US20020005729A12002-01-17
US6598194B12003-07-22
US20030051091A12003-03-13
US20030061409A12003-03-27
US6255849B12001-07-03
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