A SYSTEM AND PROCESS FOR VIEWING A MARKING ON A DIAMOND

WIPO Patent Application WO/2020/221353

A1

A process for viewing an identification inscription (140,240,340a,340b) extending along one or more girdle facets of a diamond, said process including the steps of applying incident light in a downward direction of towards the identification inscription (140,240,340a,340b) and towards the pavilion facets (150,255) of the diamond, such that an optical representation of the inscription (140,240,340a,340b) is projected onto and internally reflected from one or more pavilion facets (150,255); and observing the reflection of the optical representation of the inscription (140,240,340a,340b) on the facets of one of the one or more pavilion facets (150,255) from above the diamond at a viewing point (130,230) and through one or more crown facets (160,260) of the diamond; wherein the focal distance of observation of the optical representation of the inscription (140,240,340a,340b) is the distance from the viewing point (130,230) to the location of the optical representation of the inscription (140,240,340a,340b) on said one of the one or more pavilion facets (150,255).

YIU YAU CHUEN (CN)
CHENG JUAN (CN)
CHENG KA WING (CN)
HUI KOON CHUNG (CN)

PCT/CN2020/088420

November 05, 2020

April 30, 2020

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GOLDWAY TECH LIMITED (CN)

A44C17/00

WO2010075428A1

2010-07-01

CN1444886A	2003-10-01
US20140139608A1	2014-05-22
JP2008018120A	2008-01-31
CN201837780U	2011-05-18
US20060137674A1	2006-06-29
US20070058775A1	2007-03-15
US20070222972A1	2007-09-27

CHINA SINDA INTELLECTUAL PROPERTY LIMITED (CN)

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