Title:
SYSTEM TESTING DEVICE, TEST RESULT STORAGE METHOD, AND TEST RESULT REFERENCE METHOD
Document Type and Number:
WIPO Patent Application WO/2016/035616
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a test result storage and reference method that makes it possible to avoid forgetting to save measurement results by automatically saving the measurement results and to reduce the amount of time required to identify the cause of a problem with a device under testing by making it possible to check the testing procedure when the problem occurred. A system testing device according to the present invention is provided with an operation unit, display unit, database unit, measurement processing unit, and communication interface unit, and is characterized in that: a plurality of measuring instruments and testers are connected to the communication interface unit; the database unit stores a test item data table, a measuring instrument data table, and test results; and the measurement processing unit has a test result determination unit, test determination unit, measuring instrument determination unit, test result acquisition processing unit, and measuring instrument processing unit.
Inventors:
SATO YUTAKA (JP)
Application Number:
PCT/JP2015/073872
Publication Date:
March 10, 2016
Filing Date:
August 25, 2015
Export Citation:
Assignee:
HITACHI INT ELECTRIC INC (JP)
International Classes:
G01D9/00; H04B17/00
Foreign References:
| JPH09304129A | 1997-11-28 | |||
| JP2009216596A | 2009-09-24 | |||
| JP2000242328A | 2000-09-08 |
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