Title:
SYSTEMS AND METHODS FOR SAMPLE ANALYSIS
Document Type and Number:
WIPO Patent Application WO/2012/094227
Kind Code:
A3
Abstract:
The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.
Inventors:
COOKS ROBERT GRAHAM (US)
LI GUANGTAO (US)
LI XIN (US)
OUYANG ZHENG (US)
LI GUANGTAO (US)
LI XIN (US)
OUYANG ZHENG (US)
Application Number:
PCT/US2011/067771
Publication Date:
January 10, 2013
Filing Date:
December 29, 2011
Export Citation:
Assignee:
PURDUE RES FOUNDATION PRF (US)
COOKS ROBERT GRAHAM (US)
LI GUANGTAO (US)
LI XIN (US)
OUYANG ZHENG (US)
COOKS ROBERT GRAHAM (US)
LI GUANGTAO (US)
LI XIN (US)
OUYANG ZHENG (US)
International Classes:
H01J49/26
Domestic Patent References:
| WO2009152945A2 | 2009-12-23 | |||
| WO2010127059A1 | 2010-11-04 |
Foreign References:
| US20080067352A1 | 2008-03-20 | |||
| US20100163722A1 | 2010-07-01 | |||
| US20080193772A1 | 2008-08-14 | |||
| US20100301209A1 | 2010-12-02 | |||
| US20080203284A1 | 2008-08-28 | |||
| US20100078550A1 | 2010-04-01 |
Attorney, Agent or Firm:
MEYERS, Thomas C. et al. (One Financial CenterBoston, MA, US)
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