Title:
TANDEM MASS SPECTROMETRY DEVICE AND PROGRAM FOR SAME DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/163926
Kind Code:
A1
Abstract:
In this invention, when data is obtained by mass spectrometry, a mass spectrum analysis unit (32) immediately determines the integration value of signal intensities on the mass spectrum for each m/z sub-range of a predetermined m/z-width into which the entire m/z range for the substance being measured is divided. Then, the mass spectrum analysis unit (32) selects only the m/z sub-ranges which have signal intensity integration values equal to or greater than a predetermined threshold value for MS/MS analysis. For each of the m/z sub-ranges selected, the MS/MS analysis is executed by an MS/MS analysis control unit (41), taking as a precursor ion an ion whereof the m/z is included within the m/z sub-range. After executing repeatedly a measurement cycle containing one iteration of mass spectrometry and one or a plurality of iterations of MS/MS analysis in this manner, an identification processing unit (35) sorts out the ions derived from an identical component on the basis of the peak retention times in an extracted-ion chromatogram of each product ion, and identifies the component. In this manner, while collecting information on a product ion derived from an ion observed in the mass spectrum as thoroughly as possible, the number of MS/MS analyses executed can be reduced, thereby shortening the time for one measurement cycle.
Inventors:
TOYAMA ATSUHIKO (JP)
YAMAMOTO HIDEKI (JP)
YAMAMOTO HIDEKI (JP)
Application Number:
PCT/JP2018/007423
Publication Date:
September 13, 2018
Filing Date:
February 28, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
H01J49/40; G01N27/62
Domestic Patent References:
WO2015107642A1 | 2015-07-23 |
Foreign References:
JP2013537312A | 2013-09-30 | |||
JP2007527992A | 2007-10-04 | |||
JP2004259452A | 2004-09-16 |
Attorney, Agent or Firm:
KYOTO INTERNATIONAL PATENT LAW OFFICE (JP)
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