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Patent Searching and Data


Title:
TARGET TRACKING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/030800
Kind Code:
A1
Abstract:
In the present invention, a multiple-target-tracking processing unit (40) uses observed values generated by an observed value extraction unit (20) to determine estimated position characteristic values for a plurality of targets using a set position estimation method. Further, the multiple-target-tracking processing unit (40) determines whether there is degeneration in the observed values on the basis of the estimated position characteristic values. If the multiple-target-tracking processing unit (40) determines that there is degeneration in the observed values, a degeneration resolution unit (50) determines estimated position characteristic values for the plurality of targets by using a position estimation method in which a target for a single observed value is estimated on the basis of predicted values for the plurality of targets. The multiple-target-tracking processing unit (40) uses the estimated position characteristic values determined by the degeneration resolution unit (50) to update the path of a correlation hypothesis determined to have observed value degeneration.

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Inventors:
NAKAMURA MASANARI (JP)
YAMADA TETSUTARO (JP)
OBATA YASUSHI (JP)
Application Number:
PCT/JP2017/028590
Publication Date:
February 14, 2019
Filing Date:
August 07, 2017
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G01S13/66
Foreign References:
JP2003149328A2003-05-21
JP2000147108A2000-05-26
JP2016223834A2016-12-28
JP2003014843A2003-01-15
JP2000505201A2000-04-25
JP2014169865A2014-09-18
JP2011242182A2011-12-01
US20130076558A12013-03-28
Other References:
BEARD, MICHAEL ET AL.: "Bayesian Multi-Target Tracking With Merged Measurements Using Labelled Random Finite Sets", IEEE TRANSACTIONS ON SIGNAL PROCESSING, vol. 63, no. 6, 15 March 2015 (2015-03-15), pages 1433 - 1447, XP011573434, DOI: doi:10.1109/TSP.2015.2393843
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
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