Title:
TEMPERATURE ABNORMALITY DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2020/213256
Kind Code:
A1
Abstract:
This temperature abnormality detection device is provided with: a plurality of infrared temperature sensors respectively capable of detecting the temperatures of mutually different detection regions of a device; and a device body having a temperature abnormality determination unit which, when the temperatures of the detection regions detected by the respective plurality of infrared temperature sensors exceed a reference temperature, determines that the temperatures of the detection regions are abnormal. The respective plurality of infrared temperature sensors are mutually connected to each other by jumper wires.
Inventors:
IKEUCHI RYO (JP)
TAKATORI KOJI (JP)
NAKAMURA TAKAHIRO (JP)
OGAWA HIRONORI (JP)
OGAWA TADAHIKO (JP)
TAKAISHI AKIRA (JP)
TAKATORI KOJI (JP)
NAKAMURA TAKAHIRO (JP)
OGAWA HIRONORI (JP)
OGAWA TADAHIKO (JP)
TAKAISHI AKIRA (JP)
Application Number:
PCT/JP2020/007091
Publication Date:
October 22, 2020
Filing Date:
February 21, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H02B3/00; G01J5/00; G01J5/10; H02B13/065
Foreign References:
| JP2016038277A | 2016-03-22 | |||
| JP2009076956A | 2009-04-09 | |||
| JP2019045192A | 2019-03-22 |
Other References:
See also references of EP 3958414A4
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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