Title:
TEMPERATURE ADJUSTABLE SAMPLE HOLDER FOR TEM OR STEM
Document Type and Number:
WIPO Patent Application WO/2017/073816
Kind Code:
A1
Abstract:
The present invention relates to a temperature adjustable sample holder for a TEM or STEM that can perform both functions of cooling and heating a sample observed using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM). More specifically, the present invention relates to a temperature adjustable sample holder for a TEM or STEM, the sample holder comprising: a support rod having a sample mounting tip on one end thereof, a sample being mounted on the sample mounting tip, wherein the support rod is mounted in a TEM or STEM such that the sample mounting tip is located in the observation region of the electron microscope; a heat control means coupled to an opposite end of the support rod to control heat; and a heat conduction rod located within the support rod and having one end connected with the heat control means while making contact with the same and an opposite end connected with the sample mounting tip while making contact with the same.
Inventors:
JEUNG JONG-MAN (KR)
KIM YOUN-JOONG (KR)
KIM JIN-GYU (KR)
KIM YOUN-JOONG (KR)
KIM JIN-GYU (KR)
Application Number:
PCT/KR2015/011543
Publication Date:
May 04, 2017
Filing Date:
October 30, 2015
Export Citation:
Assignee:
KOREA BASIC SCIENCE INST (KR)
International Classes:
H01J37/20
Foreign References:
| US5075555A | 1991-12-24 | |||
| JPH06260125A | 1994-09-16 | |||
| US20130264476A1 | 2013-10-10 | |||
| JP2005158288A | 2005-06-16 | |||
| US20130014528A1 | 2013-01-17 |
Attorney, Agent or Firm:
KIM, Wonjoon (KR)
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