Title:
TEMPERATURE DETECTION CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2017/150013
Kind Code:
A1
Abstract:
In order to provide a temperature detection circuit capable of diagnosing a failure of a temperature monitoring circuit, while suppressing a circuit scale increase and a cost increase, a temperature detection circuit (1) is provided with a temperature measuring circuit (10), an arithmetic circuit (20), a temperature monitoring circuit (30), and a diagnostic signal generation circuit (40). The temperature measuring circuit (10) outputs, to a measurement node (N1), a temperature measurement voltage (V1) corresponding to a temperature. The arithmetic circuit (20) calculates the temperature on the basis of the temperature measurement voltage (V1). In the cases where the temperature measurement voltage (V1) is within a predetermined abnormal voltage range, the temperature monitoring circuit (30) validates an abnormality detection signal (V2) indicating a temperature abnormality. When a failure of the temperature monitoring circuit (30) is diagnosed, the diagnostic signal generation circuit (40) supplies a diagnostic signal to the measurement node (N1), and changes the temperature measurement voltage (V1).
Inventors:
YANO JUNYA
Application Number:
PCT/JP2017/002432
Publication Date:
September 08, 2017
Filing Date:
January 25, 2017
Export Citation:
Assignee:
SANYO ELECTRIC CO (JP)
International Classes:
G01K7/00
Foreign References:
| JP2014185992A | 2014-10-02 | |||
| JPS5616827A | 1981-02-18 | |||
| JP2014167418A | 2014-09-11 |
Attorney, Agent or Firm:
TOKUDA Yoshiaki et al. (JP)
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