Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
TEMPERATURE DETECTION CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2018/167812
Kind Code:
A1
Abstract:
Provided is a temperature detection circuit that reduces detection time and enables the operations of a diode, a transistor, etc. to be checked. The present invention is provided with: a plurality of thermostats that change the levels of output signals when an abnormality in temperature has been detected; a microprocessor that receives the signals output from the plurality of thermostats; a plurality of circuits that connect the plurality of thermostats and the microprocessor; connection points at which the plurality of circuits are connected; resistors in the plurality of circuits that connect the connection points and the plurality of thermostats; and voltage detection terminals in a circuit that connects the resistors and the plurality of thermostats, in a circuit that that connects the at least one resistor and the connection points, and in a circuit that connects the connection points and the microprocessor.

Inventors:
SAEKI YOSUKE
KURODA KAZUTO
TAKAHASHI JUN
NOZAWA RYO
SEKINO MASAHIRO
Application Number:
PCT/JP2017/009898
Publication Date:
September 20, 2018
Filing Date:
March 13, 2017
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
TOSHIBA KK (JP)
TOSHIBA INFRASTRUCTURE SYSTEMS & SOLUTIONS CORP (JP)
International Classes:
G01K7/00; G01K15/00
Foreign References:
JP2001091367A2001-04-06
JP2004108987A2004-04-08
JPH09243467A1997-09-19
JP2008039451A2008-02-21
JPH08103599A1996-04-23
Other References:
See also references of EP 3598092A4
Attorney, Agent or Firm:
INOUE, Masanori (JP)
Download PDF: