Title:
TEMPERATURE DISTRIBUTION MEASURING SYSTEM, TEMPERATURE DISTRIBUTION MEASURING APPARATUS, AND METHOD
Document Type and Number:
WIPO Patent Application WO/2003/029773
Kind Code:
A1
Abstract:
Temperature distribution on an object surface can be measured by using a simple, cheap apparatus utilizing ordinary visible light instead of special infrared rays. That is, intensity distribution of visible light of a predetermined color reflected from an object surface is relatively divided into a plurality of stages, thereby measuring the temperature distribution of the object surface.
Inventors:
HAMASAKI HIROSI (JP)
MURASE HIROYUKI (JP)
FUNAKOSHI TOORU (JP)
MURASE HIROYUKI (JP)
FUNAKOSHI TOORU (JP)
Application Number:
PCT/JP2002/008487
Publication Date:
April 10, 2003
Filing Date:
August 22, 2002
Export Citation:
Assignee:
ALPHAMEDICA CO LTD (JP)
HAMASAKI HIROSI (JP)
MURASE HIROYUKI (JP)
FUNAKOSHI TOORU (JP)
HAMASAKI HIROSI (JP)
MURASE HIROYUKI (JP)
FUNAKOSHI TOORU (JP)
International Classes:
G01J3/50; A61B5/00; A61B5/01; G01J5/00; G01J5/48; (IPC1-7): G01J5/48; A61B5/00; G01J3/50; G01K11/12; H04N7/18
Foreign References:
| JP2001157214A | 2001-06-08 | |||
| JPH05180705A | 1993-07-23 | |||
| JPH0843211A | 1996-02-16 |
Attorney, Agent or Firm:
Matsuo, Kenichiro (Imaizumikoporasu 4-26, Imaizumi 2-chome, Chuo-k, Fukuoka-shi Fukuoka, JP)
Download PDF:
Previous Patent: IMAGING ARRAY
Next Patent: THERMOPLASTIC APPARATUS FOR CONDITIONING THE TEMPERATURE OF A FLUID
Next Patent: THERMOPLASTIC APPARATUS FOR CONDITIONING THE TEMPERATURE OF A FLUID