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Title:
TEMPERATURE ESTIMATION METHOD, DETERIORATION STATE ESTIMATION METHOD, AND LIFESPAN PREDICTION METHOD FOR SECONDARY BATTERY MODULE, TEMPERATURE ESTIMATION DEVICE, DETERIORATION STATE ESTIMATION DEVICE, AND LIFESPAN PREDICTION DEVICE FOR SECONDARY BATTERY MODULE, AND CHARGING DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/039018
Kind Code:
A1
Abstract:
A method of estimating the temperature of a secondary battery module comprises: a step for acquiring charging feature data including a current and a voltage supplied to the secondary battery module and a charging time during charging; and a step for estimating the temperature of a secondary battery constituting the secondary battery module by collating the charging feature data with correlation data between existing charging feature data stored in a database and the temperature. Accordingly, even when temperature information of the secondary battery constituting the secondary battery module cannot be obtained, the temperature of the secondary battery can be estimated.

Inventors:
YAMAUCHI SHUKO (JP)
YAMAZOE TAKANORI (JP)
MAKINO SHIGEKI (JP)
Application Number:
PCT/JP2020/022639
Publication Date:
March 04, 2021
Filing Date:
June 09, 2020
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
H01M10/48; G01R31/367; G01R31/392; H02J7/00
Domestic Patent References:
WO2019097664A12019-05-23
Foreign References:
JP2019124612A2019-07-25
JPH11162526A1999-06-18
JP2001085071A2001-03-30
JP2011018532A2011-01-27
JP2010246320A2010-10-28
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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