Title:
TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT SYSTEM, AND TEMPERATURE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/054785
Kind Code:
A1
Abstract:
The temperature measurement device 10 pertaining to the present invention is provided with a first irradiation part 11a for radiating a pulsed excitation light L1 to a substance included in a chemical reaction system 20, a second irradiation part 11b for radiating a probe light L2 to the substance, a detection part 12 for detecting the probe light L2 radiated to the substance by the second irradiation part 11b, and a control part 15 for calculating the temperature of the substance included in the chemical reaction system 20 on the basis of information relating to the detection intensity of the probe light L2 detected by the detection part 12.
Inventors:
OGAWA JUNICHI (JP)
MIYAZAKI SHUNICHI (JP)
MIYAZAKI SHUNICHI (JP)
Application Number:
PCT/JP2019/035778
Publication Date:
March 19, 2020
Filing Date:
September 11, 2019
Export Citation:
Assignee:
YOKOGAWA ELECTRIC CORP (JP)
International Classes:
G01K11/12
Foreign References:
| JP2011106990A | 2011-06-02 | |||
| JP2009109321A | 2009-05-21 | |||
| JPH10176962A | 1998-06-30 | |||
| JP2003322628A | 2003-11-14 | |||
| JP2000002677A | 2000-01-07 | |||
| JP2006258537A | 2006-09-28 | |||
| JPH08110270A | 1996-04-30 |
Other References:
See also references of EP 3851819A4
Attorney, Agent or Firm:
SUGIMURA Kenji (JP)
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