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Patent Searching and Data


Title:
TEMPERATURE MEASUREMENT METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2018/126366
Kind Code:
A1
Abstract:
A temperature measurement method and apparatus. The temperature measurement method comprises: collecting measurement values of at least two temperature sensors, the at least two temperature sensors being located in a temperature measurement space of an object to be measured (201); determining, according to a variation tend of the measurement values of the at least two temperature sensors, that the temperature measurement space is switched from a closed state to a non-closed state (202);and obtaining a temperature value of the object to be measured according to the measured values of the at least two temperature sensors when the temperature measurement space is in the non-closed state (203). By using the method, the accuracy of temperature measurement can be improved.

Inventors:
KANG HONG (CN)
HUANG JIANHUA (CN)
XU SHUNLI (CN)
Application Number:
PCT/CN2017/070189
Publication Date:
July 12, 2018
Filing Date:
January 04, 2017
Export Citation:
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Assignee:
WELL DIAGNOSTICS TECH INTERNATIONAL CORPORATION (CN)
International Classes:
A61B5/01; G01K13/00
Foreign References:
CN204600434U2015-09-02
CN104173026A2014-12-03
CN104161498A2014-11-26
CN104490368A2015-04-08
CN106197745A2016-12-07
CN1389713A2003-01-08
CN104048771A2014-09-17
JP2010230538A2010-10-14
Attorney, Agent or Firm:
TEKYRS INTELLECTUAL PROPERTY INC. (CN)
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