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Patent Searching and Data


Title:
TEMPERATURE MEASUREMENT SYSTEM AND TEMPERATURE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2020/036075
Kind Code:
A1
Abstract:
The present invention makes it possible to use an infrared camera having a resolution that is insufficient for the punching pattern in an area of mesh-like openings in a front panel provided in a rack to determine the temperature of an ICT device inside the rack from the other side of the front panel. This system (40) is for measuring the temperature (Tm) of an ICT device (20) accommodated in a rack (10) provided with a front panel (12) having an area of mesh-like openings. The system (40) comprises an area-to-be-measured extraction means (42) for detecting the temperature of each pixel in data for the rack measured by an infrared camera (30) opposing the front panel and extracting an area to be measured (14), an averaging means (44) for determining the average temperature (Tavg) of the area to be measured, and an information-and-communications-technology-device temperature calculation means (47) for calculating the temperature (Tm) of an ICT device accommodated in the rack from the average temperature and the porosity (ρ) and temperature (Tp) of the front panel.

Inventors:
WATANABE TOSHIO (JP)
HAYASHI KATSUYA (JP)
TANAKA YURIKO (JP)
Application Number:
PCT/JP2019/030350
Publication Date:
February 20, 2020
Filing Date:
August 01, 2019
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01J5/48
Foreign References:
JP2009168462A2009-07-30
JPH10206241A1998-08-07
JPS6491027A1989-04-10
JP2015508490A2015-03-19
JP2017181346A2017-10-05
JP2009236888A2009-10-15
JP2013002861A2013-01-07
US20100044567A12010-02-25
Other References:
TOSHIO WATANABE ET AL: "Study on hot-spot detection in an ICT rack by using thermography", IEICE TECHNICAL REPORT, vol. 117, no. 449, 22 February 2018 (2018-02-22), pages 339 - 344
Attorney, Agent or Firm:
TANI & ABE, P.C. (JP)
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