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Patent Searching and Data


Title:
TEMPERATURE MEASURING DEVICE, AMBIENT TEMPERATURE MEASURING METHOD, AND AMBIENT TEMPERATURE MEASURING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/163363
Kind Code:
A1
Abstract:
A terminal temperature measuring element (30) is disposed close to, in a housing (90), a terminal to which a thermocouple (600) is connected, and a first internal temperature measuring element (31) and a second internal temperature measuring element (32) are disposed, in a housing (900), at positions closer to a heat generating source than the terminal temperature measuring element (30). The difference between influence of heat generated from the heat generating source to the first internal temperature measuring element (31), and influence of the heat generated from the heat generating source to the second internal temperature measuring element (32) changes in accordance with the attitude of the housing (90). A main control unit (20) calculates, using the temperature measured by the three temperature measuring elements, the ambient temperature of the housing (90).

Inventors:
NISHIDE Miho (801 Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-sh, Kyoto 30, 〒6008530, JP)
KUNIYASU Yuki (801 Minamifudodo-cho, Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku, Kyoto-sh, Kyoto 30, 〒6008530, JP)
Application Number:
JP2019/001737
Publication Date:
August 29, 2019
Filing Date:
January 22, 2019
Export Citation:
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Assignee:
OMRON CORPORATION (801 Minamifudodo-cho, Horikawahigashiiru Shiokoji-dori, Shimogyo-ku, Kyoto-sh, Kyoto 30, 〒6008530, JP)
International Classes:
G01K1/20; G01K7/12
Foreign References:
JPH09133588A1997-05-20
DE102013109809A12015-03-12
JP2002286556A2002-10-03
JP2018112502A2018-07-19
Attorney, Agent or Firm:
KAEDE PATENT ATTORNEYS' OFFICE (1-4-34, Noninbashi Chuo-ku, Osaka-sh, Osaka 11, 〒5400011, JP)
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