Title:
TEMPERATURE MEASURING METHOD USING MICRO TEMPERATURE SENSING ELEMENT
Document Type and Number:
WIPO Patent Application WO/2005/001403
Kind Code:
A1
Abstract:
A temperature measuring method using a micro temperature sensing element, wherein a variation in the temperature and length of the continuous columnar gallium of the temperature sensing element formed of a carbon nano tube containing the gallium is preliminarily measured, the temperature sensing element is fitted to an article to be temperature-measured and the article is heated in the air, the temperature sensing element is removed and the length of the gallium is measured, and the measured length of the gallium is finally given by an expression. Thus, temperatures in a wide temperature range can be accurately measured in the environment of micro meter size or below.
Inventors:
Bando, Yoshio c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Gao, Yihua c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Liu, Zongwen c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Golberg, Dmitri c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Gao, Yihua c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Liu, Zongwen c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Golberg, Dmitri c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Application Number:
PCT/JP2004/009615
Publication Date:
January 06, 2005
Filing Date:
June 30, 2004
Export Citation:
Assignee:
NATIONAL INSTITUTE FOR MATERIALS SCIENCE (2-1 Sengen 1-chome, Tsukuba-shi, Ibaraki, 305-0047, JP)
Bando, Yoshio c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Gao, Yihua c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Liu, Zongwen c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Golberg, Dmitri c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Bando, Yoshio c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Gao, Yihua c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Liu, Zongwen c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
Golberg, Dmitri c/o National Institute for (Materials Science 2-1, Sengen 1-chom, Tsukuba-shi Ibaraki, 305-0047, JP)
International Classes:
B82B3/00; G01K5/02; G01K5/10; (IPC1-7): G01K5/02; B82B1/00
Attorney, Agent or Firm:
Nishizawa, Toshio (Three F Minami Aoyama Bldg. 7F, 11-1 Minami-Aoyama 6-chom, Minato-ku Tokyo, 107-0062, JP)