TEMPERATURE MEASURING SYSTEM, TEMPERATURE MEASURING METHOD, AND LASER PROCESSING DEVICE

Title:

TEMPERATURE MEASURING SYSTEM, TEMPERATURE MEASURING METHOD, AND LASER PROCESSING DEVICE

Document Type and Number:

WIPO Patent Application WO/2020/080368

Kind Code:

A1

Abstract:

This temperature measuring system is provided with: a first light receiving unit which receives a first light component of light emitted by a measurement target object that is radiating heat, the first light component having a first wavelength; a second light receiving unit which receives a second light component of the light, the second light component having a second wavelength longer than the first wavelength; a third light receiving unit which receives a third light component of the light, the third light component having a third wavelength shorter than the first wavelength or longer than the second wavelength; and a processing unit which adjusts the intensity of the first light component received by the first light receiving unit and the intensity of the second light component received by the second light receiving unit, on the basis of the intensity of the third light component received by the third light receiving unit, and calculates the temperature of the measurement target object using a two-color method, on the basis of the adjusted intensity of the first light component and the adjusted intensity of the second light component.

Inventors:

IWAMA MASAKI (JP)

Application Number:

PCT/JP2019/040515

Publication Date:

April 23, 2020

Filing Date:

October 15, 2019

Export Citation:

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Assignee:

FURUKAWA ELECTRIC CO LTD (JP)

International Classes:

G01J5/60

Foreign References:

EP2887031A1	2015-06-24
JP2008268106A	2008-11-06
JPH08152360A	1996-06-11
JP2003245789A	2003-09-02
JP2015208763A	2015-11-24
JP2019020370A	2019-02-07
JP2014234981A	2014-12-15
JPH0314437U	1991-02-14
JP1638473A	1973-02-09
JP2007192579A	2007-08-02

Other References: