Title:
TEMPERATURE SENSOR THERMAL CONTACT TESTING METHOD AND CIRCUIT
Document Type and Number:
WIPO Patent Application WO/2019/103264
Kind Code:
A1
Abstract:
The present invention relates to a testing method for the thermal contact between a temperature sensor (50) and a battery cell (10) of a battery module (30), wherein the method comprises the steps of measuring a temperature T1 of the temperature sensor (50) at a time point t1, heating the temperature sensor (50) for a defined time (t2-t1), measuring a temperature T2 of the temperature sensor (50) at a time point t2 and/or a temperature T3 of the temperature sensor (50) at a time point t3, and determining the thermal contact between the temperature sensor (50) and the battery cell (10) based on at least one of the temperature differences ΔT2,1=(T2-T1), ΔT3,1=(T3-T1) and/or ΔT3,2=(T3-T2). The invention further relates to a testing circuit (60) for a temperature sensor (50) of a battery module (30), comprising a thermistor (61) with a first node (67) connected to a first supply voltage (65) and a second node (68) connected to ground (69), a switch (63) interconnected between the first node (67) of the thermistor (61) and a second supply voltage (66), and an analog-to-digital converter (64) connected in parallel to the thermistor (61). The invention further relates to a cell supervision circuit (40) for a battery module (30), comprising a circuit carrier (45), a testing circuit (60) according to any one of the claims 1 to 10, and a temperature sensor (50) surface mounted to the circuit carrier (45) and comprising a measuring head (51) with a thermistor (61) configured to be brought into thermal contact with a battery cell (10) of the battery module (30).
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Inventors:
HOFER MAXIMILIAN (AT)
HAMMERSCHMIED HELMUT (AT)
HAMMERSCHMIED HELMUT (AT)
Application Number:
PCT/KR2018/006273
Publication Date:
May 31, 2019
Filing Date:
June 01, 2018
Export Citation:
Assignee:
SAMSUNG SDI CO LTD (KR)
International Classes:
H01M10/48; G01K1/02; G01K15/00; H01M10/42
Foreign References:
| US20020048309A1 | 2002-04-25 | |||
| US20140369376A1 | 2014-12-18 | |||
| US20050258800A1 | 2005-11-24 | |||
| US20100136392A1 | 2010-06-03 | |||
| JP2007018826A | 2007-01-25 |
Attorney, Agent or Firm:
PANKOREA PATENT AND LAW FIRM (KR)
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