Title:
TERAHERTZ WAVE MEASUREMENT DEVICE, TERAHERTZ WAVE MEASUREMENT METHOD, AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2016/132452
Kind Code:
A1
Abstract:
A terahertz wave measurement device (100) is provided with an irradiation means (110) for irradiating terahertz waves (THz) onto an object of measurement (10), a detection means (130, 151) for generating a first detection signal by detecting the terahertz waves irradiated onto the object of measurement, a storage means (170) for storing signal characteristics (171) of a plurality of second detection signals that it is assumed would be detected if terahertz waves were irradiated onto a plurality of different objects of measurement having different measurement object characteristics, and a specification means (152) for specifying the measurement object characteristics of the measurement object on the basis of the signal characteristics of the first detection signal and the signal characteristics of the plurality of second detection signals.
Inventors:
OCHIAI TAKANORI (JP)
TAKAHASHI KAZUO (JP)
TAKAHASHI KAZUO (JP)
Application Number:
PCT/JP2015/054284
Publication Date:
August 25, 2016
Filing Date:
February 17, 2015
Export Citation:
Assignee:
PIONEER CORP (JP)
International Classes:
G01B15/02; G01B11/06
Foreign References:
| JP2014122875A | 2014-07-03 | |||
| JP2009198338A | 2009-09-03 | |||
| JP2014119407A | 2014-06-30 | |||
| JP2013536422A | 2013-09-19 | |||
| JP2010533300A | 2010-10-21 |
Other References:
WANLI TU: "FDTD-based quantitative analysis of terahertz wave detection for multilayered structures", JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A, vol. 31, no. 10, 1 October 2014 (2014-10-01), pages 2285 - 2293
Attorney, Agent or Firm:
EGAMI, Tatsuo et al. (JP)
Tatsuo Egami (JP)
Tatsuo Egami (JP)
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