Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
TERAHERTZ-WAVE SPECTROMETER
Document Type and Number:
WIPO Patent Application WO/2012/132647
Kind Code:
A1
Abstract:
In this terahertz-wave spectrometer (1), a dispersing prism (31) is provided with a prism part (52) capable of sliding with respect to a main part (51). A plurality of placement regions (K) on which substances to be measured (34) are laid out, in the direction in which the prism part (52) slides, on a placement surface (31c) (namely, the top surface) of the prism part (52). Thus, when optical constants of one substance (34) are finished being measured, the prism part (52) can be slid in order to move the next substance to be measured (34) into the path of terahertz waves (T), making it easy to measure a plurality of substances (34) without cleaning the placement surface (31c) in between.

Inventors:
YASUDA TAKASHI (JP)
AKIYAMA KOUICHIRO (JP)
KAWADA YOICHI (JP)
NAKANISHI ATSUSHI (JP)
TAKAHASHI HIRONORI (JP)
Application Number:
PCT/JP2012/054159
Publication Date:
October 04, 2012
Filing Date:
February 21, 2012
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HAMAMATSU PHOTONICS KK (JP)
YASUDA TAKASHI (JP)
AKIYAMA KOUICHIRO (JP)
KAWADA YOICHI (JP)
NAKANISHI ATSUSHI (JP)
TAKAHASHI HIRONORI (JP)
International Classes:
G01N21/35
Foreign References:
JP2007271361A2007-10-18
JP2008224449A2008-09-25
JP2008224451A2008-09-25
JP2008224452A2008-09-25
JP2000121551A2000-04-28
JP2006200931A2006-08-03
JP2007024540A2007-02-01
JP2008224449A2008-09-25
Other References:
See also references of EP 2693200A4
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Yoshiki Hasegawa (JP)
Download PDF:
Claims:



 
Previous Patent: PLANT CULTIVATION DEVICE

Next Patent: WORKPIECE COLLECTING DEVICE