Title:
TEST APPARATUS, CALIBRATION METHOD AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2010/095167
Kind Code:
A1
Abstract:
Provided is a test apparatus that tests devices to be tested, and that is provided with a first terminal group and a second terminal group that have multiple signal I/O parts, each of which outputs a signal to a terminal of a tested device and to which a signal output from the terminal is input, a measurement part that measures the difference in signal I/O reference phases for each pair of the first terminal group signal I/O parts and the second terminal group signal I/O parts connected to each other when the respective signal I/O parts of the first terminal group and the respective signal I/O parts of the second terminal group are connected to each other, and an adjustment part that brings the reference phases close to each other based on the difference in reference phases for each pair of first terminal group signal I/O parts and second terminal group signal I/O parts connected to each other.
Inventors:
MATSUBARA YASUO (JP)
Application Number:
PCT/JP2009/000646
Publication Date:
August 26, 2010
Filing Date:
February 17, 2009
Export Citation:
Assignee:
ADVANTEST CORP (JP)
MATSUBARA YASUO (JP)
MATSUBARA YASUO (JP)
International Classes:
G01R31/28
Domestic Patent References:
| WO2007072738A1 | 2007-06-28 |
Attorney, Agent or Firm:
RYUKA IP LAW FIRM (JP)
Ryuka international patent business corporation (JP)
Ryuka international patent business corporation (JP)
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