Title:
TEST CIRCUIT CAPABLE OF EFFICIENTLY UTILIZING MOUNTING AREA
Document Type and Number:
WIPO Patent Application WO/2023/043020
Kind Code:
A1
Abstract:
The present invention relates to a test circuit that receives a test command from an automatic test equipment (ATE) and tests a DUT, wherein the test circuit comprises: a plurality of analog test circuits electrically connected to the DUT to test operations; and a digital control circuit for controlling operations of the analog test circuits, wherein the digital control circuit and the analog test circuits are spaced apart from each other.
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Inventors:
KIM HYOUNG-RAE (KR)
LEE DONG-YUL (KR)
HA JUN-HYUNG (KR)
LEE DONG-YUL (KR)
HA JUN-HYUNG (KR)
Application Number:
PCT/KR2022/009982
Publication Date:
March 23, 2023
Filing Date:
July 08, 2022
Export Citation:
Assignee:
TECHWIDU CO LTD (KR)
International Classes:
G01R31/28; G01R1/073; G01R31/3163; G01R31/317; G01R31/3181
Foreign References:
| JP3778050B2 | 2006-05-24 | |||
| JP2010276374A | 2010-12-09 | |||
| KR101028792B1 | 2011-04-12 | |||
| KR100676185B1 | 2007-01-30 | |||
| US20160178667A1 | 2016-06-23 |
Attorney, Agent or Firm:
KIM, Kyung Soo (KR)
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