Title:
TEST CIRCUIT AND TEST SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/237367
Kind Code:
A1
Abstract:
A test circuit and a test system. The test circuit comprises an electronic load (20) and a capacitor module (30). The electronic load (20) comprises a first input end (201) and a second input end (202). The first input end (201) is used for connecting to a first output end (101) of a charging device (10). The second input end (202) is used for connecting to a second output end (102) of the charging device (10). The electronic load (20) is used for testing a pulse signal outputted by the charging device (10). The capacitor module (30) is provided between the first input end (201) and the second input end (202). When the voltage of the pulse signal outputted by the charging device (10) is lower than a first voltage threshold, the capacitor module (30) is used for supplying power to the charging device (10). When the electronic load (20) is used for testing the pulse signal outputted by the charging device (10) and when the voltage of the pulse signal is lower than the first voltage threshold, the capacitor module (30) can supply power to the charging device (10) so that the power to the charging device (10) is uninterrupted, thus allowing a test to be completed successfully.
Inventors:
TIAN CHEN (CN)
Application Number:
PCT/CN2018/091694
Publication Date:
December 19, 2019
Filing Date:
June 15, 2018
Export Citation:
Assignee:
GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP LTD (CN)
International Classes:
G01R31/00
Domestic Patent References:
| WO2007039091A1 | 2007-04-12 |
Foreign References:
| CN104836210A | 2015-08-12 | |||
| CN206209022U | 2017-05-31 | |||
| CN105527520A | 2016-04-27 | |||
| CN204008746U | 2014-12-10 | |||
| CN105974243A | 2016-09-28 | |||
| JP2011176987A | 2011-09-08 | |||
| US20120248870A1 | 2012-10-04 |
Attorney, Agent or Firm:
ESSEN PATENT & TRADEMARK AGENCY (CN)
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