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Patent Searching and Data


Title:
TEST DESIGN ASSISTANCE DEVICE, TEST DESIGN ASSISTANCE METHOD, PROGRAM, AND COMPUTER-READING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2014/141500
Kind Code:
A1
Abstract:
A test design assistance device (10) acquires, for each of a plurality of factors to be tested, information about the number of levels indicating the number of values which the factors can take on, selects, from among matrices to which factors having a plurality of levels generated on the basis of an orthogonal table can be mapped, a matrix to which all of factors having a maximum number of levels in the information can be mapped, and sets, to a number of levels of interest, a maximum number of levels from among the number of levels of factors not mapped to the s elected matrix. Then, when the number of columns in the selected matrix, to which factors having the number of levels of interest can be mapped, is greater than or equal to the number of factors having the number of levels of inter est, factors having the number of levels of interest are mapped to the matrix; and, when the number of columns in the selected matrix, to which factors having the number of levels of interest can be mapped, is not greater than or equal to the number of factors having the number of levels of interest, and there remains an excess column in the matrix, to which factors having a greater number of levels than the number of levels of interest can be mapped, the excess column is decomposed into columns to which the number of levels of interest can be mapped, whereby the matrix is updated.

Inventors:
AKIYAMA Koichi (7-3, Akasaka 9-chome, Minato-k, Tokyo 52, 〒1070052, JP)
Application Number:
JP2013/072113
Publication Date:
September 18, 2014
Filing Date:
August 19, 2013
Export Citation:
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Assignee:
FUJI XEROX CO., LTD. (7-3 Akasaka 9-chome, Minato-ku Tokyo, 52, 〒1070052, JP)
International Classes:
G06F11/28
Foreign References:
JP2002259464A2002-09-13
JP2007041784A2007-02-15
JP2010113551A2010-05-20
JP2006252316A2006-09-21
Other References:
KOICHI AKIYAMA: "Chokkohyo ni yoru Kumiawase Test Nyumon Moraritsu & Koritsusei no Takai Test Jisshi no Tebiki", SOFTWARE.TEST PRESS, vol. 2, 5 January 2006 (2006-01-05), pages 89 - 107
Attorney, Agent or Firm:
TAKAMATSU Takeshi et al. (Koh-Ei Patent Firm, Toranomon East Bldg. 9F 7-13, Nishi-Shimbashi 1-chome, Minato-k, Tokyo 03, 〒1050003, JP)
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