TEST DEVICE, AND TEST METHOD USING TEST DEVICE FOR TESTING

Title:

TEST DEVICE, AND TEST METHOD USING TEST DEVICE FOR TESTING

Document Type and Number:

WIPO Patent Application WO/2023/155689

Kind Code:

A1

Abstract:

Disclosed in the present invention are a test device and a test method using the test device for testing. The device comprises: a first coplanar waveguide and a second coplanar waveguide. The first coplanar waveguide comprises a first central conductor strip, and first edge grounding strips located on the two sides of the first central conductor strip. The second coplanar waveguide comprises a second central conductor strip, and second edge grounding strips located on the two sides of the second central conductor strip. The first edge grounding strips located on the two sides of the first central conductor strip and the second edge grounding strips located on the two sides of the second central conductor strip are an integral whole. A target position for connecting a Josephson junction to be tested is reserved between the first central conductor strip and the second central conductor strip. The first coplanar waveguide and the second coplanar waveguide are combined to form a first resonant cavity of the test device. The present invention solves the technical problem that the Josephson junction is difficult to be improved in a targeted manner because different loss mechanisms of the Josephson junction cannot be quantitatively distinguished and measured.

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Inventors:

DENG HAO (CN)

Application Number:

PCT/CN2023/074263

Publication Date:

August 24, 2023

Filing Date:

February 02, 2023

Export Citation:

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Assignee:

ALIBABA DAMO HANGZHOU TECH CO LTD (CN)

International Classes:

G01R31/26; G06N10/00

Domestic Patent References:

WO2020043415A1

2020-03-05

Foreign References:

CN114200282A	2022-03-18
CN111505478A	2020-08-07
CN112668270A	2021-04-16
CN113642279A	2021-11-12
CN113707800A	2021-11-26
US20210311101A1	2021-10-07

Attorney, Agent or Firm:

BEIJING TONGJUN LAW FIRM (CN)

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