Title:
TEST DEVICE AND TEST MODULE
Document Type and Number:
WIPO Patent Application WO/2008/062719
Kind Code:
A1
Abstract:
Provided is a test device for testing a device under test (DUT). The test device includes:
a signal supply unit which supplies a test signal to a DUT; an input unit which inputs
an output signal outputted from the DUT in accordance with the test signal as a
signal to be measured; a cyclic pulse generation unit which generates a cyclic
pulse having a pulse width corresponding to one cycle of the signal to be measured
according to a sample clock specifying the timing to sample the signal to be measured;
a conversion unit which outputs a voltage corresponding to the width of the cyclic
pulse; an AD converter which converts a voltage into a digital voltage value;
a pulse width calculation unit which calculates a digital pulse width indicating
a pulse width of the cyclic pulse from the digital voltage value; and an adjusting
unit which adjusts a conversion parameter used to perform conversion from the
digital voltage value to a digital pulse width.
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Inventors:
MITSUHASHI, Naofumi (1-32-1 Asahi-cho, Nerima-k, Tokyo 71, 1790071, JP)
Application Number:
JP2007/072227
Publication Date:
May 29, 2008
Filing Date:
November 15, 2007
Export Citation:
Assignee:
ADVANTEST CORPORATION (1-32-1, Asahi-cho Nerima-k, Tokyo 71, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 1790071, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 1790071, JP)
International Classes:
G01R31/28; G01R29/02; G01R31/28; G01R29/02
Attorney, Agent or Firm:
RYUKA, Akihiro (5F Shinjuku Square Tower, 22-1 Nishi-Shinjuku 6-chome,Shinjuku-k, Tokyo 05, 1631105, JP)
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