Title:
TEST DEVICE AND TEST SYSTEM COMPRISING SAME
Document Type and Number:
WIPO Patent Application WO/2024/005497
Kind Code:
A1
Abstract:
A test device according to an embodiment comprises: a first substrate having, arranged therein, a data conversion module including a first connector for receiving data acquired from external equipment, a field programmable gate array (FPGA) for converting the received data, and a second connector for outputting the converted data; a second substrate having, arranged therein, a test module including a third connector that is connected to the second connector of the first substrate and that receives the converted data, a test element for performing a test operation by using data received through the third connector, a communication element for transmitting, to the outside, test result information according to the test operation result of the test element, and a control element for controlling the test element and the communication element; and a housing for accommodating the first substrate and the second substrate.
Inventors:
KIM SANG UK (KR)
CHOI MIN YONG (KR)
KIM DONG CHOON (KR)
CHOI MIN YONG (KR)
KIM DONG CHOON (KR)
Application Number:
PCT/KR2023/008909
Publication Date:
January 04, 2024
Filing Date:
June 27, 2023
Export Citation:
Assignee:
LG INNOTEK CO LTD (KR)
International Classes:
H04N17/00; G06F11/22; H04N5/44
Foreign References:
| KR101853694B1 | 2018-05-02 | |||
| JP2021036425A | 2021-03-04 | |||
| KR102124964B1 | 2020-06-23 | |||
| KR102176447B1 | 2020-11-09 | |||
| KR100765010B1 | 2007-10-09 |
Attorney, Agent or Firm:
HAW, Yong Noke (KR)
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