Title:
TEST DEVICE AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2010/021131
Kind Code:
A1
Abstract:
A test device for testing a device under test having a plurality of blocks which operate asynchronously is provided with a plurality of domain test units provided for each block in the plurality of blocks, and a main unit for controlling the plurality of domain test units. The main unit has a basic operating clock generator for generating a basic operating clock which is supplied to each unit in the plurality of domain test units, and a start test signal generator in which the start test signal for indicating the start of a test is generated for each unit in the plurality of domain test units. Each unit in the plurality of domain test units has a test clock generator for generating a test clock on the basis of the basic operating clock, and generates a test signal for testing each block in a plurality of corresponding blocks on the basis of the test clock obtained from the test clock generator. Each unit in the plurality of domain test units starts to generate the test signal under the condition that the start test signal has been received.
Inventors:
KANTAKE SHUSUKE (JP)
Application Number:
PCT/JP2009/003954
Publication Date:
February 25, 2010
Filing Date:
August 19, 2009
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KANTAKE SHUSUKE (JP)
KANTAKE SHUSUKE (JP)
International Classes:
G01R31/28
Foreign References:
| JP2008525761A | 2008-07-17 | |||
| JPH10160808A | 1998-06-19 | |||
| JP2008519286A | 2008-06-05 | |||
| JP2008064467A | 2008-03-21 | |||
| JP2006179144A | 2006-07-06 |
Attorney, Agent or Firm:
RYUKA, AKIHIRO (JP)
Akihiro Ryuka (JP)
Akihiro Ryuka (JP)
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