Title:
TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/047111
Kind Code:
A1
Abstract:
The present invention identifies a disconnection-fault by-pass diode. A test device (11) comprises the following: a signal introduction circuit (26) for applying a disconnection position identification signal (51b) between a positive electrode and a negative electrode of a solar battery string (3); and a fault computation part (45) for identifying the by-pass diode for which a disconnection-fault occurred, on the basis of the alternating current component of voltage between a frame ground and the positive electrode or the alternating current component of voltage between the frame ground and the negative electrode in a case where the disconnection position identification signal (51b) is applied.
Inventors:
TAKEUCHI TSUYOSHI (JP)
MISUMI SHUICHI (JP)
SANO AKIHIKO (JP)
MISUMI SHUICHI (JP)
SANO AKIHIKO (JP)
Application Number:
PCT/JP2016/053184
Publication Date:
March 23, 2017
Filing Date:
February 03, 2016
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
H02S50/00; G01R31/02
Foreign References:
| JP2012238716A | 2012-12-06 | |||
| JP2014033184A | 2014-02-20 | |||
| JP2013157458A | 2013-08-15 |
Other References:
See also references of EP 3352372A4
Attorney, Agent or Firm:
MURAKAMI, Takashi (JP)
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