Title:
TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/006609
Kind Code:
A1
Abstract:
Disclosed is a test device for testing electric characteristics of an object-to-be-tested. The test device includes: a test socket including a probe configured to transmit a test signal to the object-to-be-tested; and a pusher unit configured to press the object-to-be-tested to move close to and away from the probe, the pusher unit including: a pressing procession configured to press the object-to-be-tested; a pusher base including the pressing projection on a first side thereof, and a plurality of heat-dissipation column insertion portions on a second side thereof; and a heat-dissipation column shaped like a bar and including one end portion to be inserted in the heat-dissipation column insertion portion, and a plurality of heat dissipation wings on an outer circumferential surface thereof.
More Like This:
Inventors:
PARK DONGHOON (KR)
Application Number:
PCT/KR2020/008897
Publication Date:
January 14, 2021
Filing Date:
July 08, 2020
Export Citation:
Assignee:
LEENO IND INC (KR)
International Classes:
G01R1/04; G01R31/28
Foreign References:
| KR20160096304A | 2016-08-16 | |||
| KR20140132172A | 2014-11-17 | |||
| KR20020039076A | 2002-05-25 | |||
| KR20140079192A | 2014-06-26 | |||
| JP2010015894A | 2010-01-21 |
Attorney, Agent or Firm:
HUH, Sung-Won et al. (KR)
Download PDF: