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Patent Searching and Data


Title:
TEST EQUIPMENT
Document Type and Number:
WIPO Patent Application WO/2005/078463
Kind Code:
A1
Abstract:
Test equipment provided with a plurality of test module slots on which different types of test modules are selectively mounted. The test equipment is provided with a plurality of control modules, a setting information supplying means, an enable signal control means and a setting means. The control modules supply a plurality of the test modules with a control signal for controlling the operation of the test modules. The setting information supplying means supplies the control modules with hardware setting information so as to give a control signal corresponding to the specific test module to the specific test module among the test modules. The enable signal control means makes the specific test module generate an enable signal to supply it to the control module. The setting means sets the control module which has received the enable signal from the specific test module and makes the control module supply the specific test module with the control signal corresponding to the specific test module.

Inventors:
MIYAZAKI MASASHI (JP)
INABA KENJI (JP)
MIURA TOSHIYUKI (JP)
Application Number:
PCT/JP2005/002350
Publication Date:
August 25, 2005
Filing Date:
February 16, 2005
Export Citation:
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Assignee:
ADVANTEST CORP (JP)
MIYAZAKI MASASHI (JP)
INABA KENJI (JP)
MIURA TOSHIYUKI (JP)
International Classes:
G01R31/28; G01R31/319; G06F19/00; (IPC1-7): G01R31/28
Foreign References:
JPS63298174A1988-12-05
JPS60135777A1985-07-19
JP2002131392A2002-05-09
JP2001051026A2001-02-23
Attorney, Agent or Firm:
Ryuka, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo, JP)
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