Title:
TEST HANDLER HAVING SIZE-CHANGEABLE TEST SITE
Document Type and Number:
WIPO Patent Application WO2006091051
Kind Code:
A3
Abstract:
A test handler (122) of the present invention includes a main body, a window (142) formed on a surface of the main body and having a size corresponding to a Hi-Fix board of MxN array (where M and N represent an integer greater than a value of =), a cover (170) detachably fixed to the main body t close a part of the window and convert the window into the test site having a size corresponding to a [M-A)x(n-B)] Hi-Fix board ( where A is an integer equal to ot greater than 0 but smaller than M, and B is an integer having a value other than 0). In the test handler, the size of window is easily modified to adapt that of the Hi-Fix board of MxN array by closing or opening a part of the window using the cover. Therefore, the test handler is capable of applying Hi-Fix boards having different sizes.
Inventors:
SHIM JAE GYUN (KR)
NA YUN SUNG (KR)
JEON IN GU (KR)
NA YUN SUNG (KR)
JEON IN GU (KR)
Application Number:
PCT/KR2006/000669
Publication Date:
December 07, 2006
Filing Date:
February 27, 2006
Export Citation:
Assignee:
TECHWING CO LTD (KR)
SHIM JAE GYUN (KR)
NA YUN SUNG (KR)
JEON IN GU (KR)
SHIM JAE GYUN (KR)
NA YUN SUNG (KR)
JEON IN GU (KR)
International Classes:
G01R31/26; G01R31/28
Foreign References:
| JP2002071755A | 2002-03-12 | |||
| US20030085160A1 | 2003-05-08 | |||
| KR950010439Y1 | 1995-12-13 |
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