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Patent Searching and Data


Title:
TEST METHOD FOR CONNECTOR, DEVICE AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2018/201763
Kind Code:
A1
Abstract:
Provided by the present invention is a test method for a connector, the method comprising: acquiring a first test signal which is sent by a first single board and which corresponds to a test instruction; acquiring a second test signal received by a second single board by means of a connector, the connector being connected between the first single board and the second single board; comparing the first test signal with the second test signal; and determining whether there is a fault in a pin on the connector according to a comparison result. By means of the embodiments of the present invention, the problem in related technology wherein the testing solution for a backplane connector is high in cost and may not be applied in a product currently being used for connector testing may be solved, and the purpose of not needing to develop a testing interface card but rather indirectly implementing connector testing by means of a service single board connected to the connector on the basis of an existing product may be achieved, thus having the technical effect of reducing the cost in developing a testing interface card.

Inventors:
GENG, Chenxi (ZTE Plaza, Keji Road SouthHi-Tech Industrial Park, Nansha, Shenzhen Guangdong 7, 518057, CN)
Application Number:
CN2018/074275
Publication Date:
November 08, 2018
Filing Date:
January 26, 2018
Export Citation:
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Assignee:
ZTE CORPORATION (ZTE Plaza, Keji Road SouthHi-Tech Industrial Park, Nansha, Shenzhen Guangdong 7, 518057, CN)
International Classes:
G01F11/22; G01R31/04
Foreign References:
CN102307118A2012-01-04
US5170113A1992-12-08
US5946332A1999-08-31
US6772380B12004-08-03
CN203606449U2014-05-21
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (2nd Floor, Zhongguancun Intellectual Property BuildingBlock B, No.21 Haidian South Road, Haidian District, Beijing 0, 100080, CN)
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