Title:
TEST PARAMETER PROCESSING METHOD AND DEVICE, TESTER, AND COMPUTER STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2017/211232
Kind Code:
A1
Abstract:
Disclosed are a test parameter processing method and device, a tester, and a computer storage medium. The method comprises: determining a test distance between a position where a test event is located, and the tester; determining, according to the test distance, a pulse width launched by the tester for testing the test event; and determining a test parameter of the tester according to the test distance, the pulse width, and a predetermined rule for determining the test parameter of the tester.
Inventors:
BAI YUXUAN (CN)
Application Number:
PCT/CN2017/086984
Publication Date:
December 14, 2017
Filing Date:
June 02, 2017
Export Citation:
Assignee:
ZTE CORP (CN)
International Classes:
H04B10/071
Foreign References:
| CN105547644A | 2016-05-04 | |||
| CN105490742A | 2016-04-13 | |||
| CN104333415A | 2015-02-04 | |||
| CN1731119A | 2006-02-08 | |||
| US20120200846A1 | 2012-08-09 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
Download PDF:
Previous Patent: CCKS-BASED TOP-UP METHOD FOR CPU CARD
Next Patent: INTEGRATED APPARATUS, EXHAUST GAS POST-PROCESSING SYSTEM, AND CONTROL METHOD
Next Patent: INTEGRATED APPARATUS, EXHAUST GAS POST-PROCESSING SYSTEM, AND CONTROL METHOD