Title:
TEST PART UNIT AND TEST HEAD
Document Type and Number:
WIPO Patent Application WO/2010/035335
Kind Code:
A1
Abstract:
In a test part unit (7) having a handle (6) which can be attached and detached without using a tool, the handle (6) has a base plate (61), two brackets (62) provided at the opposite ends of the base plate (61), a handle bar (63) extending between the brackets (62), and two guide shafts (64) and two index plungers (65) provided on the base plate (61). On the other hand, two guide holes (53) extending in the plane direction of a performance board (51), and two plunger holes (54) extending in the thickness direction of the performance board (51) are formed in the performance board (51) of a test part unit body (5).
Inventors:
TAKESHITA, Satoshi (32-1 Asahicho 1-chome Nerima-k, Tokyo 71, 17900, JP)
Application Number:
JP2008/067531
Publication Date:
April 01, 2010
Filing Date:
September 26, 2008
Export Citation:
Assignee:
ADVANTEST CORPORATION (32-1, Asahicho 1-chome Nerima-k, Tokyo 71, 17900, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 17900, JP)
株式会社アドバンテスト (〒71 東京都練馬区旭町１丁目３２番１号 Tokyo, 17900, JP)
International Classes:
G01R31/26; G01R31/28
Attorney, Agent or Firm:
HAYAKAWA, Yuzi et al. (Arcadia Patent Firm, Suite 501 Hikawa-Annex No.2,9-5, Akasaka 6-chome,Minato-k, Tokyo 52, 10700, JP)
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