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Title:
TEST PROBE OF DETECTION APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/156779
Kind Code:
A1
Abstract:
A test probe (20) of a detection apparatus. The test probe comprises a probe sheath (10) and the probe (20). The probe sheath (10) comprises a first connecting end (11), a second connecting end (12) and a connecting lead (13). The connecting lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12). The probe (20) is inserted on the second connecting end (12). The first connecting end (11) is welded onto a test PCB board (30) and forms a first signal connection area on that position. Other signal connection areas are provided on the test PCB board (30). Since the connection lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12), when the probe is inserted on the second connecting end (12), the probe (20) can be inserted into the test PCB board (30) from other signal connection areas and from a long distance and with a large span, thereby completing a test task for a functional module on a test board under the test PCB board (30).

Inventors:
NIE, Linhong (ULMT Industrial Park, NO.14 Road 1, Zhangkengjing Xiawei Industrial Area, Guanlan Street, Longhua New Distric, Shenzhen Guangdong 0, 518110, CN)
Application Number:
CN2016/076760
Publication Date:
September 21, 2017
Filing Date:
March 18, 2016
Export Citation:
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Assignee:
SHENZHEN ULMT TECHNOLOGY CO.,LTD (ULMT Industrial Park, NO.14 Road 1, Zhangkengjing Xiawei Industrial Area, Guanlan Street, Longhua New Distric, Shenzhen Guangdong 0, 518110, CN)
International Classes:
G01R1/067
Domestic Patent References:
WO2006002163A22006-01-05
Foreign References:
US4414506A1983-11-08
CN204188665U2015-03-04
CN102985833A2013-03-20
CN204330832U2015-05-13
CN204101604U2015-01-14
Attorney, Agent or Firm:
BEIJING LAWSING IP FIRM (Suite 122/123, Block ANo. 4 Baiguang Road, Xicheng District, Beijing 3, 100053, CN)
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