TEST PROBE OF DETECTION APPARATUS

WIPO Patent Application WO/2017/156779

A1

A test probe (20) of a detection apparatus. The test probe comprises a probe sheath (10) and the probe (20). The probe sheath (10) comprises a first connecting end (11), a second connecting end (12) and a connecting lead (13). The connecting lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12). The probe (20) is inserted on the second connecting end (12). The first connecting end (11) is welded onto a test PCB board (30) and forms a first signal connection area on that position. Other signal connection areas are provided on the test PCB board (30). Since the connection lead (13) is flexibly connected between the first connecting end (11) and the second connecting end (12), when the probe is inserted on the second connecting end (12), the probe (20) can be inserted into the test PCB board (30) from other signal connection areas and from a long distance and with a large span, thereby completing a test task for a functional module on a test board under the test PCB board (30).

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NIE LINHONG (CN)

PCT/CN2016/076760

September 21, 2017

March 18, 2016

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SHENZHEN ULMT TECH CO LTD (CN)

G01R1/067

WO2006002163A2

2006-01-05

US4414506A	1983-11-08
CN204188665U	2015-03-04
CN102985833A	2013-03-20
CN204330832U	2015-05-13
CN204101604U	2015-01-14

BEIJING LAWSING IP FIRM (CN)

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