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Title:
TEST PROBE AND MACHINING METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2013/187611
Kind Code:
A1
Abstract:
Disclosed are a test probe and a machining method of a test probe, the test probe including a plunger end part contacting a tested contact point, the plunger end part including a plurality of tips protruding toward the tested contact point, and at least one of the plurality of tips is a higher tip and at least another one of the plurality of tips is a lower tip that is lower than the higher tip.

Inventors:
LEE CHAE YOON (KR)
Application Number:
PCT/KR2013/004504
Publication Date:
December 19, 2013
Filing Date:
May 23, 2013
Export Citation:
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Assignee:
LEENO IND INC (KR)
International Classes:
G01R1/067; G01R31/26
Foreign References:
KR100659944B12006-12-21
KR20100034142A2010-04-01
KR20050081894A2005-08-19
KR101154519B12012-06-13
JP2003533703A2003-11-11
JP2002174642A2002-06-21
JP2010060316A2010-03-18
Attorney, Agent or Firm:
HUH, Sung-Won et al. (1599-11 Seocho-dong,Seocho-gu, Seoul 137-912, KR)
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