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Patent Searching and Data


Title:
TEST PROBE, TESTING SYSTEM, AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2015/155877
Kind Code:
A1
Abstract:
 The probe is provided with: an excitation direction control means (125) for controlling the excitation direction, using a magnetizer (111) which has two or more excitation coils (111a-111d), and in which the legs facing towards a body under inspection (300) are positioned at equidistant intervals on a circle; a magnetooptical thin film sensor (112) positioned in an area to the inside of the circle where the legs of the magnetizer (111) are positioned; and a magnetic field image acquisition means (121) for acquiring magnetic field image data, using the magnetooptical thin film sensor (112). In so doing, decline in detection sensitivity can be minimized, regardless of the shape of an imperfection, or the thickness of the excitation coils.

Inventors:
ENDOU HISASHI (JP)
Application Number:
PCT/JP2014/060445
Publication Date:
October 15, 2015
Filing Date:
April 10, 2014
Export Citation:
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Assignee:
HITACHI LTD (JP)
International Classes:
G01N27/83; G01B11/30; G01R33/032
Foreign References:
JPH10288603A1998-10-27
JPS55177653U1980-12-19
JPH06294773A1994-10-21
JPH02269956A1990-11-05
JPS62141756U1987-09-07
US5773973A1998-06-30
Other References:
G.L. FITZPATRICK ET AL.: "Detection of cracks under cladding using magneto-optic imaging and rotating in-plane magnetization", PROC. SPIE, vol. 2947, 14 November 1996 (1996-11-14), pages 106 - 116, XP055229523
SHIGERU ANDO: "Lock-in magneto-optic imaging and analysis for detecting surface and internal flaws of steel", CURRENT ADVANCES IN MATERIALS AND PROCESSES, vol. 17, no. 5, 1 September 2004 (2004-09-01), pages 948 - 951
Attorney, Agent or Firm:
KAICHI IP (JP)
Patent business corporation development-of-knowledge international patent firm (JP)
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