Title:
TEST PROGRAM, TEST METHOD AND PROCESSING DEVICES
Document Type and Number:
WIPO Patent Application WO/2013/105237
Kind Code:
A1
Abstract:
In one system applying the invention, when conducting a test for confirming an operation of multiple processing devices, the test is executed in parallel by the multiple processing devices. Among the multiple processing devices, a processing device that has finished the test is made to assess whether said processing device should operate as a first processing device that outputs the result of the test executed by each of the multiple processing devices, and among processing devices that have finished the test, a processing device assessed as the processing device that should operate as the first processing device is made to operate as the first processing device.
Inventors:
OKAMURA NORIHIKO (JP)
ICHIKAWA FUMIO (JP)
ICHIKAWA FUMIO (JP)
Application Number:
PCT/JP2012/050403
Publication Date:
July 18, 2013
Filing Date:
January 11, 2012
Export Citation:
Assignee:
FUJITSU LTD (JP)
OKAMURA NORIHIKO (JP)
ICHIKAWA FUMIO (JP)
OKAMURA NORIHIKO (JP)
ICHIKAWA FUMIO (JP)
International Classes:
G06F11/22
Foreign References:
| JPH1153209A | 1999-02-26 | |||
| JPH1049397A | 1998-02-20 | |||
| JP2002007361A | 2002-01-11 | |||
| JP2005122375A | 2005-05-12 |
Attorney, Agent or Firm:
OSUGA, Yoshiyuki (JP)
Yoshiyuki Osuge (JP)
Yoshiyuki Osuge (JP)
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