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Patent Searching and Data


Title:
TEST SAMPLE NOTCH POSITIONING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/128366
Kind Code:
A1
Abstract:
The embodiments of the present invention propose a test sample notch positioning method and device, relating to the field of automation in the steel industry. The method and device determine a photographing parameter according to a received test sample cooling temperature, acquire a sample image to be processed acquired by an image acquisition device in the photographing parameter state, then filter said sample image to acquire key test sample image information, and finally acquire positional information concerning a test sample notch on the basis of a plurality of pre-established image recognition models and the key test sample image information. As different test sample cooling temperatures affect photographing results differently, there is always a suitable photographing parameter corresponding to each cooling temperature, so that said acquired sample image is always in a relatively clear state for facilitating subsequent operations such as background separation and test sample notch positioning, improving both the efficiency of acquiring the positional information concerning the test sample notch and the accuracy of the positional information.

Inventors:
SUN MAOJIE (CN)
LI FUCUN (CN)
SU XUNLIANG (CN)
ZHOU DING (CN)
Application Number:
PCT/CN2018/109073
Publication Date:
July 04, 2019
Filing Date:
September 30, 2018
Export Citation:
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Assignee:
JIANGSU JINHENG INFORMATION TECH CO LTD (CN)
International Classes:
G06T7/70
Foreign References:
CN108460798A2018-08-28
CN105092406A2015-11-25
CN105988343A2016-10-05
CN107492074A2017-12-19
Attorney, Agent or Firm:
JIANGSU SUNDY LAW FIRM (CN)
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