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Patent Searching and Data


Title:
TEST SAMPLE PREPARATION METHOD AND TEST SAMPLE PREPARATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/258250
Kind Code:
A1
Abstract:
A test sample preparation method, comprising the following steps: using raw materials for formulating test samples to formulate a plurality of standard slurries with different initial water-gel ratios (S110); respectively placing the plurality of standard slurries with different initial water-gel ratios in a plurality of sampling moulds (200), and then testing the actual water-gel ratio of the standard slurry in each sampling mould (200) (S120); on the basis of the plurality of actual water-gel ratios and the plurality of initial water-gel ratios, establishing a functional relationship of the actual water-gel ratios and the initial water-gel ratios (S130); on the basis of the functional relationship and the water-gel ratio of a test sample, calculating the formulation water-gel ratio of the test sample (S140); on the basis of the formulation water-gel ratio, formulating the raw materials into a sample slurry (S150); and placing the sample slurry in a sampling mould (200) to obtain a test sample (S160). The present test sample preparation method enables the test samples to be at a micron level and have a regular size, and be capable of being used in an X-ray nano CT scan test.

Inventors:
FENG WEIPENG (CN)
DONG ZHIJUN (CN)
JIN YU (CN)
CUI HONGZHI (CN)
Application Number:
PCT/CN2019/093695
Publication Date:
December 30, 2020
Filing Date:
June 28, 2019
Export Citation:
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Assignee:
SHENZHEN INST INFORMATION TECH (CN)
International Classes:
G01N1/38; G01N1/36; G01N23/046
Foreign References:
CN109521059A2019-03-26
CN105092423A2015-11-25
CN102230875A2011-11-02
CN106872235A2017-06-20
CN106874692A2017-06-20
CN108760611A2018-11-06
JP2016222500A2016-12-28
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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